Quality & Metrology
Process Capability Simulator
Analyze statistical process capabilities (Cp and Cpk). Manipulate specification boundaries, process drift, and variability to understand yield optimization and quality defect rates.
Capability
Capable (Excellent)
Cpk = 1.53
Spec Window
1.20
USL - LSL
Calculations
Norm-Dist
DPMO based
Parameters
Animated process drift
Statistical Governing Equations
Cp (Process Capability)
Cp = (USL - LSL) / 6σ
Cpk (Adjusted Capability)
Cpk = min( (USL - μ)/3σ, (μ - LSL)/3σ )
DPMO Calculation
DPMO = (P(X < LSL) + P(X > USL)) * 10^6
Six Sigma standard requires Cpk >= 1.50 (Currently: 1.53)
Process centering: μ is offset from spec center by 0.05 units.
Expected Yield is 100.000% (Defects: 2 per million parts produced).
Statistical Spec Distribution
Cp Index
1.67
Cpk Index
1.53
Estimated Yield
100.000%
Defects (DPMO)
2ppm
Cpk Sensitivity vs Mean Shift
Capability Sensitivity Table
| Process Mean (μ) | Cp Index | Cpk Index | Yield (%) |
|---|---|---|---|
| 9.00 | 1.67 | 0.00 | 0.04% |
| 9.10 | 1.67 | 0.00 | 0.62% |
| 9.20 | 1.67 | 0.00 | 4.78% |
| 9.30 | 1.67 | 0.00 | 20.23% |
| 9.40 | 1.67 | 0.00 | 50.00% |
| 9.50 | 1.67 | 0.28 | 79.77% |
| 9.60 | 1.67 | 0.56 | 95.22% |
| 9.70 | 1.67 | 0.83 | 99.38% |
| 9.80 | 1.67 | 1.11 | 99.96% |
| 9.90 | 1.67 | 1.39 | 100.00% |
| 10.00 | 1.67 | 1.67 | 100.00% |
| 10.10 | 1.67 | 1.39 | 100.00% |
| 10.20 | 1.67 | 1.11 | 99.96% |
| 10.30 | 1.67 | 0.83 | 99.38% |
| 10.40 | 1.67 | 0.56 | 95.22% |
| 10.50 | 1.67 | 0.28 | 79.77% |
| 10.60 | 1.67 | 0.00 | 50.00% |
| 10.70 | 1.67 | 0.00 | 20.23% |
| 10.80 | 1.67 | 0.00 | 4.78% |
| 10.90 | 1.67 | 0.00 | 0.62% |
| 11.00 | 1.67 | 0.00 | 0.04% |